| 9031 |
|
|
Measuring or checking instruments, appliances and machines, not specified or included elsewhere in this chapter; profile projectors; parts and accessories thereof: |
-- |
| 9031.10.00.00 |
Free |
The duty provided in the applicable subheading plus 25% |
Machines for balancing mechanical parts |
vs-9031 |
| 9031.20.00.00 |
1.7% |
The duty provided in the applicable subheading plus 25% |
Test benches
Other optical instruments and appliances: |
vs-9031100000 |
| 9031.41.00 |
Free |
The duty provided in the applicable subheading plus 25% |
For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) |
vs-9031200000 |
| 9031.41.00.20 |
Free |
The duty provided in the applicable subheading plus 25% |
For inspecting photomasks or reticles used in manufacturing semiconductor devices
For inspecting semiconductor wafers or devices: |
vs-90314100 |
| 9031.41.00.40 |
Free |
The duty provided in the applicable subheading plus 25% |
For wafers |
vs-9031410020 |
| 9031.41.00.60 |
Free |
The duty provided in the applicable subheading plus 25% |
Other |
vs-9031410040 |
| 9031.49 |
|
|
Other: |
vs-9031410060 |
| 9031.49.10.00 |
Free |
The duty provided in the applicable subheading plus 25% |
Profile projectors |
vs-903149 |
| 9031.49.40.00 |
Free |
The duty provided in the applicable subheading plus 25% |
Coordinate-measuring machines |
vs-9031491000 |
| 9031.49.70.00 |
Free |
The duty provided in the applicable subheading plus 25% |
For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices |
vs-9031494000 |
| 9031.49.90.00 |
Free |
The duty provided in the applicable subheading plus 25% |
Other |
vs-9031497000 |
| 9031.80 |
|
|
Other instruments, appliances and machines: |
vs-9031499000 |
| 9031.80.40.00 |
Free |
The duty provided in the applicable subheading plus 25% |
Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles |
vs-903180 |
| 9031.80.80 |
Free |
The duty provided in the applicable subheading plus 25% |
Other
Equipment for testing the characteristics of internal combustion engines: |
vs-9031804000 |
| 9031.80.80.60 |
Free |
The duty provided in the applicable subheading plus 25% |
For testing electrical characteristics |
vs-90318080 |
| 9031.80.80.70 |
Free |
The duty provided in the applicable subheading plus 25% |
Other |
vs-9031808060 |
| 9031.80.80.85 |
Free |
The duty provided in the applicable subheading plus 25% |
Other |
vs-9031808070 |
| 9031.90 |
|
|
Parts and accessories: |
vs-9031808085 |
| 9031.90.21.00 |
Free |
The duty provided in the applicable subheading plus 25% |
Of profile projectors
Of other optical instruments and appliances, other than test benches: |
vs-903190 |
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